Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...

The nanoIR3 from Bruker is an advanced nanoscale IR spectroscopy, property mapping, and chemical imaging system for life science and materials applications. The system offers IR-based chemical imaging ...

Click on the Tune Tab in the Master Panel. Set the tune high and low frequency according to the cantilevers being used and the application. For general tapping mode cantilevers: ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure HORIBA has introduced a new AFM optical ...

The combination of Atomic Force Microscopy (AFM) and Raman spectroscopy provides deep insights into the complex properties of various materials. While Raman spectroscopy facilitates the chemical ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

PISCATAWAY, NJ — March 4, 2025 — HORIBA, a global leader in analytical and measurement technologies, proudly announces the launch of the SignatureSPM™, a new, multimodal characterization system built ...

PeakForce Tapping has been widely adopted in a broad range of research fields, outpacing all other recently developed AFM modes in research impact and productivity. In December 2009, a new mode for ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...